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high-voltage test circuit

См. также в других словарях:

  • Voltage doubler — A voltage doubler is an electronic circuit which charges capacitors from the input voltage and switches these charges in such a way that, in the ideal case, exactly twice the voltage is produced at the output as at its input. The simplest of… …   Wikipedia

  • Test probe — Typical passive oscilloscope probe being used for testing an integrated circuit. A test probe (test lead, test prod, or scope probe) is a physical device used to connect electronic test equipment to the device under test (DUT). They range from… …   Wikipedia

  • Test and tagging — is a generic name given to the process of visually inspecting and electrically testing in service electrical equipment for personal use and/or safety. Colloquially, it is also referred to as; tagging, test tag, test and tag, electrical tagging,… …   Wikipedia

  • Test light — Neon test lamp for line voltages A test light, test lamp, voltage tester, or mains tester is a very simple piece of electronic test equipment used to determine the presence or absence of an electric voltage in a piece of equipment under test.… …   Wikipedia

  • Printed circuit board — Part of a 1983 Sinclair ZX Spectrum computer board; a populated PCB, showing the conductive traces, vias (the through hole paths to the other surface), and some mounted electrical components A printed circuit board, or PCB, is used to… …   Wikipedia

  • Arc-fault circuit interrupter — An arc fault circuit interrupter (AFCI) is a circuit breaker designed to prevent fires by detecting non working electrical arcs and disconnect power before the arc starts a fire. The AFCI should distinguish between a working arc that may occur in …   Wikipedia

  • Automatic test pattern generation — ATPG (acronym for both Automatic Test Pattern Generation and Automatic Test Pattern Generator) is an electronic design automation method/technology used to find an input (or test) sequence that, when applied to a digital circuit, enables testers… …   Wikipedia

  • Open-circuit time constant method — The open circuit time constant method is an approximate analysis technique used in electronic circuit design to determine the corner frequency of complex circuits. It also is known as the zero value time constant technique. The method provides a… …   Wikipedia

  • Design For Test — (aka Design for Testability or DFT ) is a name for design techniques that add certain testability features to a microelectronic hardware product design. The premise of the added features is that they make it easier to develop and apply… …   Wikipedia

  • Integrated circuit piezoelectric sensor — An Integrated circuit piezoelectric or ICP sensor is used to measure piezoelectricity in circuitry.ICP is an acronym for integrated circuit piezoelectric , and is a registered trademark of PCB Group, Inc.(1,603,466), parent company of PCB… …   Wikipedia

  • Application-specific integrated circuit — An application specific integrated circuit (ASIC) is an integrated circuit (IC) customized for a particular use, rather than intended for general purpose use. For example, a chip designed solely to run a cell phone is an ASIC.In contrast, the… …   Wikipedia

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